The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

8 Plasma Electronics » 8.1 Plasma production and diagnostics

[15p-B309-1~19] 8.1 Plasma production and diagnostics

Wed. Mar 15, 2023 1:00 PM - 6:45 PM B309 (Building No. 2)

Tsuyohito Ito(Univ. of Tokyo), Manabu Tanaka(Kyushu Univ.)

3:15 PM - 3:30 PM

[15p-B309-8] Three-dimensional reconstruction method using the fourier-bessel method in surface wave plasmas

Miharu Niimoto1, Akio San1, Haruhiko Himura1, Takaya Ninomiya1, Shinichiro Inagaki1 (1.KIT)

Keywords:plasma process, three dimensional monitoring, surface wave plasma

The purpose of this research is to develop a passive monitoring system using image measurement to evaluate the uniformity of deposition in plasma processes. The system uses the Fourier-Bessel method to obtain the three-dimensional distribution of plasma emission from images taken through a lens array with multiple lenses of different focal lengths. In this presentation, we will discuss the results of image reconstruction on test data and quantitative evaluation of the accuracy of the reconstruction in relation to the camera's line of sight.