The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[15p-D511-1~11] 15.7 Crystal characterization, impurities and crystal defects

Wed. Mar 15, 2023 1:30 PM - 4:45 PM D511 (Building No. 11)

Hidetoshi Suzuki(Miyazaki Univ.), Eiji Kamiyama(GlobalWafers Japan)

2:00 PM - 2:15 PM

[15p-D511-2] Relationship between Dislocation and Wire Cross-sectional Shape in Si Wire Formation by Anodization

〇(B)Miyuki Kochi1, Ayaho Midori1, Toshiaki Suzuki1, Masaaki Niwa1, Mitsuya Motohashi1 (1.Tokyo Denki Univ.)

Keywords:silicon, anodization, wire

We have developed a method to fabricate Si wires by anodizing a single-crystal Si substrate with dislocations in HF solution. It was investigated that the relationship between the shape of dislocations and the cross-sectional shape of the wire. The pen pressure during groove formation and anodization time were varied. These shapes were observed by FE-SEM. As a result, it was found that the cross-sectional shape of the wire can be controlled by pen pressure.It was also confirmed that the cross-sectional shape strongly depends on the shape of dislocations.