The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

13 Semiconductors » 13.8 Optical properties and light-emitting devices

[17p-B410-1~12] 13.8 Optical properties and light-emitting devices

Fri. Mar 17, 2023 1:30 PM - 4:45 PM B410 (Building No. 2)

Yasushi Nanai(National Defense Academy), Jun Tatebayashi(Osaka Univ.)

1:45 PM - 2:00 PM

[17p-B410-2] Change in Photoluminescence Properties and Crystal Structure of Lanthanoid Ion-Implanted GaN after High-Pressure Annealing

Shin Ito1,2, Shin-ichiro Sato2, Michal Bockowski3, Manato Deki4, Hirotaka Watanabe5, Shugo Nitta5, Yoshio Honda5, Hiroshi Amano4,5, Kenichi Yoshida6, Hideki Minagawa6, Naoto Hagura1 (1.Tokyo City Univ., 2.QST, 3.PAS, 4.Nagoya Univ. VBL, 5.Nagoya Univ. IMaSS, 6.ITC)

Keywords:Gallium nitride, Lanthanoid ion, high-pressure annealing

Showing stable and narrow-band photon emissions at room temperature, isolated lanthanoids in gallium nitride (GaN) are expected to be applied to single photon sources used for quantum communications. In this study, GaN epitaxial films implanted with neodymium (Nd) or praseodymium (Pr) ions are thermally annealed under ultra-high pressure, and their room temperature photoluminescence properties are investigated. Recovery from ion implantation damage is analyzed by XRD and Raman spectroscopy, and the relationship between the optical properties and the implantation damage is discussed.