The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power devices, process technology and characterization

[18a-A301-1~13] 13.7 Compound and power devices, process technology and characterization

Sat. Mar 18, 2023 9:00 AM - 12:30 PM A301 (Building No. 6)

Kozo Makiyama(Sumitomo Electric Industries, Ltd.)

10:00 AM - 10:15 AM

[18a-A301-5] Demonstration of switching operation in EID AlGaN/GaN MOS-HEMT

Takuma Nanjo1, Yamamoto Shotaro1, Shinagawa Tomohiro1, Watahiki Tatsuro1, Furuhashi Masayuki1, Nishikawa Kazuyasu1, Egawa Takashi2 (1.Advanced Technology R&D Center, Mitsubishi Electric Corporation, 2.Nagoya Inst. of Tech.)

Keywords:HEMT, GaN, EID

Planer-type EID AlGaN/GaN MOS-HEMTs using fully depleted AlGaN/GaN epitaxial layer were fabricated. The EID-HEMTs with gate width of 150 mm exhibited E-mode operation and stable swtiching operation at drain voltage of 200 V and drain current of 7A.