[1Cp01-07] Surface Analysis/Applied Surface Science/Evaluation Technique (ASS)

[1Cp04] Multimodal valence band photoelectron spectroscopy by SX-VUV dual beam momentum microscope

*Fumihiko Matsui¹, Kenta Hagiwara¹, Eiken Nakamura¹, Shigemasa Suga² (1. Institute for Molecular Science, 2. SANKEN, Osaka University)

Photoelectron momentum microscope (PMM) is an instrument built on a new concept based on imaging-type photoelectron spectroscopy and microscopy techniques to visualize the electronic state in k reciprocal lattice space of a selected microscopic region. We constructed a PMM station at the soft X-ray undulator beamline BL6U of UVSOR synchrotron facility. With a hν range up to 800 eV covered by the BL6U, core-level excitation of a variety of important elements including C, N, O and transition metals is possible. Specific atomic sites and electronic states can be selectively characterized by the Resonant momentum-resolved photoelectron spectroscopy. Furthermore, a branch was added to BL7U, an undulator-based vacuum ultraviolet (VUV 6-40 eV) beamline. In addition to grazing-incidence soft X-ray excitation, normal-incidence VUV with variable polarization excitation is also available at the same focal position of the PMM.