[S-IIIB-12] The Breakdown Behavior of Short-Channel CMOS Devices Under High-Frequency Operations

Chung-Yu Wu, Sheng-Hsiung Chou, Hong-Jen Wu, Ing-Dar Liu (1.Department of Electronics Engineering and Institute of Electronics National Chiao Tung University, 2.United Mecroelectronics Corporation)

https://doi.org/10.7567/SSDM.1988.S-IIIB-12