The Breakdown Behavior of Short-Channel CMOS Devices Under High-Frequency Operations

Chung-Yu Wu; Sheng-Hsiung Chou; Hong-Jen Wu; Ing-Dar Liu

doi:https://doi.org/10.7567/SSDM.1988.S-IIIB-12

[S-IIIB-12] The Breakdown Behavior of Short-Channel CMOS Devices Under High-Frequency Operations

Chung-Yu Wu、Sheng-Hsiung Chou、Hong-Jen Wu、Ing-Dar Liu (1.Department of Electronics Engineering and Institute of Electronics National Chiao Tung University、2.United Mecroelectronics Corporation)

https://doi.org/10.7567/SSDM.1988.S-IIIB-12

1988 International Conference on Solid State Devices and Materials

[S-IIIB-12] The Breakdown Behavior of Short-Channel CMOS Devices Under High-Frequency Operations