[A-1-3] Spatial Distribution of Trapped Holes in the Oxide of MOSFETs after Uniform Hot-Hole Injection

QUAZI Deen Mohd Khosru、Naoki YASUDA、Akinori MARUYAMA、Kenji TANIGUCHI、Chihiro HAMAGUCHI (1.Department of Electronic Engineering, Osaka University)

https://doi.org/10.7567/SSDM.1991.A-1-3