[PC5-11] A New Method to Estimate Grain Boundary Trap State Density in Poly-Si TFTs

N. Kato, S. Yamada, Y. Nishihara, M. Fuse, T. Hamano (1.Electronic Imaging and Devices Research Laboratory, Fuji Xerox Co., Ltd.)

https://doi.org/10.7567/SSDM.1991.PC5-11