[PC6-2] Hot Carrier Reliability of Submicron Ultra Thin SOI-MOSFET's

Yasuo YAMAGUCHI、Masahiro SHIMIZU、Yasuo INOUE、Tadashi NISHIMURA、Yoichi AKASAKA (1.LSI Laboratory, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1991.PC6-2