[B-6-4] Analysis of Mechanisms for Hot-Carrier-Induced VLSI Circuit Degradation

Yoonjong Huh, Dooyoung Yang, Sungwook Kim, Yungkwon Sung (1.ULSI Laboratory, LG Semicon, Co., Ltd., 2.Korea University, Electrical Engineering Dept.)

https://doi.org/10.7567/SSDM.1995.B-6-4