[B-6-4] Analysis of Mechanisms for Hot-Carrier-Induced VLSI Circuit Degradation

Yoonjong Huh、Dooyoung Yang、Sungwook Kim、Yungkwon Sung (1.ULSI Laboratory, LG Semicon, Co., Ltd.、2.Korea University, Electrical Engineering Dept.)

https://doi.org/10.7567/SSDM.1995.B-6-4