Large 1/f Noise in Polysilicon TFT Loads and Its Effects on the Stability of SRAM Cells

Masaaki Aoki; Takashi Hashimoto; Toshiaki Yamanaka; Takahiro Nagano

doi:https://doi.org/10.7567/SSDM.1995.B-7-1

1995 International Conference on Solid State Devices and Materials

1995年8月21日〜 1995年8月24日
International House, Osaka, Japan

[B-7-1] Large 1/f Noise in Polysilicon TFT Loads and Its Effects on the Stability of SRAM Cells

Masaaki Aoki、Takashi Hashimoto、Toshiaki Yamanaka、Takahiro Nagano (1.Central Research Laboratory, Hitachi, Ltd.、2.Semiconductor and Integrated Circuits Division, Hitachi, Ltd.)

https://doi.org/10.7567/SSDM.1995.B-7-1

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