Large 1/f Noise in Polysilicon TFT Loads and Its Effects on the Stability of SRAM Cells

Masaaki Aoki; Takashi Hashimoto; Toshiaki Yamanaka; Takahiro Nagano

doi:https://doi.org/10.7567/SSDM.1995.B-7-1

[B-7-1] Large 1/f Noise in Polysilicon TFT Loads and Its Effects on the Stability of SRAM Cells

Masaaki Aoki, Takashi Hashimoto, Toshiaki Yamanaka, Takahiro Nagano (1.Central Research Laboratory, Hitachi, Ltd., 2.Semiconductor and Integrated Circuits Division, Hitachi, Ltd.)

https://doi.org/10.7567/SSDM.1995.B-7-1

1995 International Conference on Solid State Devices and Materials

[B-7-1] Large 1/f Noise in Polysilicon TFT Loads and Its Effects on the Stability of SRAM Cells