[PC-10-10] An Accurate Impact Ionization Current Model for LDD SOI MOSFETs

S. Pidin, N. Terao, T. Matsumoto, Y. Inoue, M. Koyanagi (1.Department of Machine Intelligence and System Engineering, Faculty of Engineering, Tohoku University, 2.Mitsubishi Electric Corporation, ULSI Laboratory)

https://doi.org/10.7567/SSDM.1995.PC-10-10