[PC-11-5] An Experimental Study of Impact Ionization Phenomena in Sub-0.1μm Si MOSFETs

Atsushi Hori, Akira Hiroki, Kaori Moriyama Akamatsu, Shinji Odanaka (1.Semiconductor Research Center, Matsushita Electric Ind. Co.)

https://doi.org/10.7567/SSDM.1995.PC-11-5