[PC-11-7] Stress Effect on the Reliability of pMOS TFTs for 16 Mb SRAM: DC Stress at Room and Elevated Temperatures

K. S. Son, H. K. Yoon, Y. J. Lee, S. Ahn, D. M. Kim (1.Semiconductor Research Laboratory, Hyundai Electronics Industry Co., LTD, and, 2.Department of Electrical Engineering, Pohang University of Science and Technology)

https://doi.org/10.7567/SSDM.1995.PC-11-7