Extremely Large Amplitude of Random Telegraph Signals in a Very Narrow Split-Gate MOSFET at Low Temperatures

Hiroki ISHIKURO; Takuya SARAYA; Toshiro HIRAMOTO; Toshiaki IKOMA

doi:https://doi.org/10.7567/SSDM.1995.PC-4-5

[PC-4-5] Extremely Large Amplitude of Random Telegraph Signals in a Very Narrow Split-Gate MOSFET at Low Temperatures

Hiroki ISHIKURO、Takuya SARAYA、Toshiro HIRAMOTO、Toshiaki IKOMA (1.Institute of Industrial Science, University of Tokyo、2.Texas Instruments Tsukuba Research & Development Center Ltd.)

https://doi.org/10.7567/SSDM.1995.PC-4-5

1995 International Conference on Solid State Devices and Materials

[PC-4-5] Extremely Large Amplitude of Random Telegraph Signals in a Very Narrow Split-Gate MOSFET at Low Temperatures