[B-5-1] Device Characteristics and Reliability of Thin Gate Dielectrics Grown by Light Wet Oxynitridation(LWO)
Moon-Sig Joo, Seok-Kiu Lee, Young-Jin Park, Jong-Choul Kim
(1.Memory R&D Division, Hyundai Electronics Industries Co., Ltd.)
https://doi.org/10.7567/SSDM.1996.B-5-1