The Japan Society of Applied Physics

[D-3-2] Three-Level Charge-Pumping Technique for Grain-Boundary Trap Evaluation in Polysilicon Thin Film Transistors

Kee-Jong Kim, Ohyun Kim (1.Department of Electronic and Electrical Engineering, Pohang University of Science and Technology)

https://doi.org/10.7567/SSDM.1996.D-3-2