[PC-5-8] Relation between Kink Effect and Impact Ionization Effect in SOI MOSFETs with Body Terminal

T. Matsumoto, Y. Kudoh, N. Terao, J. Kim, M. Koyanagi (1.Dept. of Machine Intelligence and System Engineering, Intelligent System Design Laboratory, Tohoku University)

https://doi.org/10.7567/SSDM.1996.PC-5-8