[Sympo.I-12] Velocity Overshoot and Gm Limitation in sub-0.1μm Fully-Depleted SOI-MOSFETs

Ryuji Ohba, Tomohisa Mizuno (1.Research and Development Center, TOSHIBA Corporation)

https://doi.org/10.7567/SSDM.1996.Sympo.I-12