[B-7-3] Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge(ESD) of SOI High-Voltage Device and IC

Hitoshi Sumida, Atsuo Hirabayashi, Hiroshi Shimabukuro (1.Fuji Electric Co., Ltd.)

https://doi.org/10.7567/SSDM.1997.B-7-3