[C-7-2] A Characteristics of Buried Channel Poly-Si TFTs

Cheol-Min Park, Juhn-Suk Yoo, Byung-Hyuk Min, Jae-Hong Jeon, Min-Koo Han (1.Room 1102, School of Electrical Engineering, Seoul National University)

https://doi.org/10.7567/SSDM.1997.C-7-2