[C-8-1] Differentiation of Effects Due to Grain and Grain Boundary Traps in Laser Annealed Poly-Si Thin Film Transistors

S. Uppal, G. A. Armstrong, S. D. Brotherton, J. R. Ayres (1.Department of Electrical and Electronic Engineering, The Queens University of Belfast, 2.Philips Research Laboratories)

https://doi.org/10.7567/SSDM.1997.C-8-1