[C-9-3] Temperature Effect on Off-State Drain Leakage Current in a Hot-Carrier Stressed n-MOSFET

T. E. Chang、L. P. Chiang、C. W. Liu、N. K. Zous、Tahui Wang (1.Department of Electronics Engineering, National Chiao-Tung University)

https://doi.org/10.7567/SSDM.1997.C-9-3