[C-9-3] Temperature Effect on Off-State Drain Leakage Current in a Hot-Carrier Stressed n-MOSFET

T. E. Chang, L. P. Chiang, C. W. Liu, N. K. Zous, Tahui Wang (1.Department of Electronics Engineering, National Chiao-Tung University)

https://doi.org/10.7567/SSDM.1997.C-9-3