[B-5-2] Hot-Carrier AC Lifetime Enhancement due to Wire Resistance Effect (WRE) in 45nm CMOS Circuits

N. Mizuguchi¹、K. Takeuchi¹、H. Tobe¹、P. Lee¹、K. Ishibashi¹ (1.Renesas Tech. Corp., Japan)

https://doi.org/10.7567/SSDM.2008.B-5-2