[B-5-2] Hot-Carrier AC Lifetime Enhancement due to Wire Resistance Effect (WRE) in 45nm CMOS Circuits

N. Mizuguchi¹, K. Takeuchi¹, H. Tobe¹, P. Lee¹, K. Ishibashi¹ (1.Renesas Tech. Corp., Japan)

https://doi.org/10.7567/SSDM.2008.B-5-2