[B-7-4] Mitigation of CMOS Variability with Metal Gate

J. W. Yang¹、C. S. Park¹、H. R. Harris¹、C. E. Smith¹、H. Adhikari¹、J. Huang¹、D. Heh¹、P. Majhi¹、R. Jammy¹ (1.SEMATECH, USA)

https://doi.org/10.7567/SSDM.2008.B-7-4