[B-9-2] Comparison of Plasma Doping with Implant for High Performance SOI CMOS Fabrication
K. L. Lee1、I. Lauer1、J. Li1、P. Porshnev2、P. Ronsheim1、J. Gardner1、P. Kozlowski1、K. Santhanam2、M. Foad2、D. G. Park1
(1.IBM、2.Applied Materials Inc., USA)
https://doi.org/10.7567/SSDM.2008.B-9-2