[D-2-1] Characteristics and Modeling of Bulk FinFETs for Circuit Application (Invited)

J. H. Lee¹、B. K. Choi¹、H. A. R. Jung¹、H. I. Kwon² (1.Kyungpook National Univ.、2.Daegu Univ., Korea)

https://doi.org/10.7567/SSDM.2008.D-2-1