[E-7-4] Tapered Through-Si Via Formation for Optical Interposer with 3D ICs and Buried Vertical-Cavity Surface-Emitting Laser / Photo Diode Chips
M. Fujiwara1,2, A. Noriki2, T. Fukushima2, T. Tanaka2, M. Koyanagi2
(1.Sumitomo Bakelite Co., Ltd., 2.Tohoku Univ., Japan)
https://doi.org/10.7567/SSDM.2008.E-7-4