[H-8-5] Dopant Freeze-out and Potential Fluctuations Observed by Low Temperature Kelvin Probe Force Microscope

M. Ligowski^1,2、M. Anwar¹、D. Moraru¹、R. Jablonski²、M. Tabe¹ (1.Shizuoka Univ., Japan、2.Warsaw Univ. of Tech., Poland)

https://doi.org/10.7567/SSDM.2008.H-8-5