[H-8-5] Dopant Freeze-out and Potential Fluctuations Observed by Low Temperature Kelvin Probe Force Microscope
M. Ligowski1,2, M. Anwar1, D. Moraru1, R. Jablonski2, M. Tabe1
(1.Shizuoka Univ., Japan, 2.Warsaw Univ. of Tech., Poland)
https://doi.org/10.7567/SSDM.2008.H-8-5