[P-3-13] Extraction of Vertical, Lateral Locations and Energies of Hot-Electrons-Induced Traps Through the Random Telegraph Noise

D. Kang¹, S. Yang¹, J. Kim², D. Lee², B. G. Park¹, Y. Son¹, J. D. Lee¹, H. Shin¹ (1.Seoul National Univ., 2.Samsung Electronics Co., Ltd., Korea)

https://doi.org/10.7567/SSDM.2008.P-3-13