Extraction of Vertical, Lateral Locations and Energies of Hot-Electrons-Induced Traps Through the Random Telegraph Noise

2008 International Conference on Solid State Devices and Materials

2008年9月23日〜 2008年9月26日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

D. Kang¹、S. Yang¹、J. Kim²、D. Lee²、B. G. Park¹、Y. Son¹、J. D. Lee¹、H. Shin¹ (1.Seoul National Univ.、2.Samsung Electronics Co., Ltd., Korea)