[P-3-14] Hot-Carrier-Induced Degradation in P-type High-Voltage DEMOS Transistors
J. F. Chen1、J. R. Lee1、S. Y. Chen1、K. S. Tian1、K. M. Wu2、C. M. Liu2
(1.National Cheng Kung Univ.、2.Taiwan Semiconductor Manufacturing Co., Ltd., Taiwan)
https://doi.org/10.7567/SSDM.2008.P-3-14