The Japan Society of Applied Physics

[P-3-18] Electrical and Structural Evaluations of Ultrathin SiGe- and Ge-on-insulator Fabricated using Ge Condensation by Dry Oxidation

H. Yang1, D. Wang1, H. Gao1, K. Hirayama1, K. Ikeda1, S. Hata1, H. Nakashima1 (1.Kyushu Univ., Japan)

https://doi.org/10.7567/SSDM.2008.P-3-18