[P-4-1] NROM Retention with Distributive Cycling Stresses

S. W. Fang¹、A. C. Kang¹、J. R. Shih²、K. Wu²、Y. C. King¹、C. J. Lin¹ (1.National Tsing Hua Univ.、2.Taiwan Semiconductor Manufacturing Co., Ltd., Taiwan)

https://doi.org/10.7567/SSDM.2008.P-4-1