[D-7-2] Substrate Noise Analysis of Digital Circuits to Optimize Substrate-Contact Space
S. Komatsu1, M. Yamaoka1, Y. Kanno1, Y. Yasu2, K. Ishibashi2, K. Osada1
(1.Hitachi, Ltd.(Japan), 2.Renesas Tech. Corp.(Japan))
https://doi.org/10.7567/SSDM.2009.D-7-2