RF Characterization and Equivalent Circuit Modeling of Ge Nanowires

J. H. Ahn; M. G. Kang; B. S. Kim; J. Lee; D. H. Hwang; D. J. Lee; H. T. Kim; S. W. Hwang; D. Whang; D. Ahn

doi:https://doi.org/10.7567/SSDM.2009.E-6-4

[E-6-4] RF Characterization and Equivalent Circuit Modeling of Ge Nanowires

J. H. Ahn¹, M. G. Kang¹, B. S. Kim², J. Lee², D. H. Hwang¹, D. J. Lee¹, H. T. Kim¹, S. W. Hwang¹, D. Whang², D. Ahn³ (1.Korea Univ.(Korea), 2.Sungkyunkwan Univ.(Korea), 3.Univ. of Seoul(Korea))

https://doi.org/10.7567/SSDM.2009.E-6-4

2009 International Conference on Solid State Devices and Materials

[E-6-4] RF Characterization and Equivalent Circuit Modeling of Ge Nanowires