[G-2-2] Charge Localization During Program and Retention in NROM-like Nonvolatile Memory Devices
E. Nowak1, E. Vianello1,2, L. Perniola1, M. Bocquet1, G. Molas1, R. Kies1, M. Gely1, G. Ghibaudo3, B. D. Salvo1, G. Reimbold1, F. Boulanger1
(1.CEA-LETI/MINATEC(France), 2.Univ. of Udine(Italy), 3.IMEP/INPG(France))
https://doi.org/10.7567/SSDM.2009.G-2-2