The Japan Society of Applied Physics

[G-2-2] Charge Localization During Program and Retention in NROM-like Nonvolatile Memory Devices

E. Nowak1, E. Vianello1,2, L. Perniola1, M. Bocquet1, G. Molas1, R. Kies1, M. Gely1, G. Ghibaudo3, B. D. Salvo1, G. Reimbold1, F. Boulanger1 (1.CEA-LETI/MINATEC(France), 2.Univ. of Udine(Italy), 3.IMEP/INPG(France))

https://doi.org/10.7567/SSDM.2009.G-2-2