[G-2-2] Charge Localization During Program and Retention in NROM-like Nonvolatile Memory Devices

E. Nowak¹、E. Vianello^1,2、L. Perniola¹、M. Bocquet¹、G. Molas¹、R. Kies¹、M. Gely¹、G. Ghibaudo³、B. D. Salvo¹、G. Reimbold¹、F. Boulanger¹ (1.CEA-LETI/MINATEC(France)、2.Univ. of Udine(Italy)、3.IMEP/INPG(France))

https://doi.org/10.7567/SSDM.2009.G-2-2