[K-1-3] Tunnel Spectroscopy of Electron Subbands in Thin SOI MOSFETs

J. Noborisaka¹, K. Nishiguchi¹, H. Kageshima¹, Y. Ono¹, A. Fujiwara¹ (1.NTT Corp.)

https://doi.org/10.7567/SSDM.2009.K-1-3