[K-1-3] Tunnel Spectroscopy of Electron Subbands in Thin SOI MOSFETs

J. Noborisaka¹、K. Nishiguchi¹、H. Kageshima¹、Y. Ono¹、A. Fujiwara¹ (1.NTT Corp.)

https://doi.org/10.7567/SSDM.2009.K-1-3