[P-10-3] Instability of Amorphous-Indium Gallium Zinc Oxide (a-IGZO) Thin Film Transistors under DC and AC Bias Stress

K. I. Choi¹、D. H. Nam¹、J. G. Park¹、S. S. Park¹、G. W. Lee¹ (1.Chungnam National Univ.)

https://doi.org/10.7567/SSDM.2009.P-10-3