[P-3-11] New Observations of FN Stress Induced Performance Degradation of RF MOSFETs

B. Xiao¹、L. Zhang¹、R. Huang¹、D. Wu¹、F. Song¹、Y. Y. Wang¹ (1.Peking Univ.)

https://doi.org/10.7567/SSDM.2009.P-3-11