The Structure and Power-level Dependences of CMOS RF Power Cell Degradation by Hot-carrier Stress with Load Pull System

C. H. Liu; Y. K. Su; R. L. Wang; C. H. Tu; Y. Z. Juang

doi:https://doi.org/10.7567/SSDM.2009.P-3-17

[P-3-17] The Structure and Power-level Dependences of CMOS RF Power Cell Degradation by Hot-carrier Stress with Load Pull System

C. H. Liu¹, Y. K. Su¹, R. L. Wang², C. H. Tu³, Y. Z. Juang³ (1.National Cheng Kung Univ. (Taiwan), 2.National Kaohsiung Normal Univ.(Taiwan), 3.CIC(Taiwan))

https://doi.org/10.7567/SSDM.2009.P-3-17

2009 International Conference on Solid State Devices and Materials

[P-3-17] The Structure and Power-level Dependences of CMOS RF Power Cell Degradation by Hot-carrier Stress with Load Pull System