[P-3-18] Anomalous Hot-Carrier-Induced Saturation Drain Current Degradation in DEMOS Transistors

J. F. Chen¹、K. W. Lin¹、S. Y. Chen¹、K. M. Wu²、J. R. Shih²、K. Wu² (1.National Cheng Kung Univ.(Taiwan)、2.TSMC(Taiwan))

https://doi.org/10.7567/SSDM.2009.P-3-18